Aehr Test Systems announces $2.5 million in orders from leading IC manufacturer

FREMONT, USA: Aehr Test Systems has received over $2.5 million in production orders for its burn-in and test systems from a leading manufacturer of advanced logic integrated circuits (ICs) for automotive, embedded processing, digital signal processing and analog applications. The orders include down payments to lock in delivery slots and volume pricing discounts.

The orders are for multiple Advanced Burn-in and Test Systems (ABTS) and a follow-on MAX system. The ABTS systems feature anew low-cost high-volume configuration targeted at production test and burn-in of lower-power devices. This new ABTS offers the option of high voltage Device Power Supplies configurable with 60V, 80V, 150V or 230V programmable voltage ranges, which are needed for automotive and power-line applications. Shipments of this new ABTS configuration are expected to begin in the fourth quarter of calendar year 2013.

The ABTS family of products is based on a new hardware and software platform that is designed to address not only today's devices, but also
future devices for many years to come. It can test and burn-in both logic and memory devices, including resources for high pin-count devices and configurations for high-power and low-power applications.

The ABTS system can be configured with up to 72 burn-in boards with up to 320 I/O channels each and 32M of test vector memory per channel. The ABTS system is optimized for use with the Sensata iSocket Thermal Management Technology, which provides a scalable cost-effective
solution using individual device temperature control for ICs up to 75 watts or more. Individual temperature control enables high-power devices with a broad range of power dissipation to be burned-in simultaneously in a single burn-in chamber while maintaining a precise device temperature. The ABTS system also uses N+1 redundancy technology for many key components in the system to maximize system uptime.