Tektronix wins best test instrument award from EEPW

BEIJING, CHINA: Tektronix Inc. a leading worldwide provider of test, measurement and monitoring instrumentation, announced that its AWG70000 arbitrary waveform generator won the best test instrument award from Electronic Engineering and Product World (EEPW) Editors' Choice Awards 2013.

EEPW is the key science and technology magazine in China. This is a second industry award win for the AWG70000 which also recently won the best test and measurement product award in the EDN China 2013 Innovation Awards.

EEPW Editors' choice awards showcase the latest technologies and hot products emerging in electronics industry over the course of one year. The winners are determined by votes from technical experts and electronic engineers.

"In the evaluation for the best test instrument award we value product performance and innovation. The AWG70000's powerful performance clearly impressed us and makes it the clear winner," said Wang Ying, the editor in chief of EEPW.

Felix Wong, Asia-Pacific Marketing Director at Tektronix said: "We are honored that AWG70000 Arbitrary waveform generator has won industry praise, which confirms Tektronix's dedication to innovation, R&D investment and manufacturing of advanced test, measurement and monitoring instruments. The AWG70000 Series combines three industry leading performance indicators: highest sample rate, best waveform memory and best SFDR. This award is a great testament to the engineering community's recognition of the importance the AWG70000's leading performance will have in the market. "

As data rates and signal complexity continue to increase across all electronics and RF segments, engineers and researchers need more advanced signal generators to fully stress test designs or to perform cutting-edge research. The ability to create, generate, or replicate either ideal, distorted, or "real-life" signals is essential in design, testing and operations of some of the world's most complex data communications systems.

The AWG70000A Series meets this need with an industry-leading combination of 50 GS/s sample rate performance, 16 GS of waveform memory and 10 bit vertical resolution. This means it produces fast, clean signals that can be routed through a receiver or other device under test for long periods of time for truly comprehensive testing.

Sample rate, dynamic range and waveform memory are key parameters for any AWG, and the AWG70000 excels at all three. The sample rate and waveform memory are unmatched by any AWG.

High dynamic range is something that is normally only found in low sample rate AWG's, however, the AWG70000 provides as much as 80 dBc of dynamic range. The AWG70000 Series helps accelerate designs and aids experimental research by enabling generation of advanced, previously impossible to generate, waveforms.