Texas Instruments (TI) expands its ADS1298 analog front end (AFE) family with the low-noise electroencephalography (EEG) AFE that enables non-invasive monitoring of brain waves
BANGALORE, INDIA: Texas Instruments (TI) expands its ADS1298 analog front end (AFE) family with the low-noise electroencephalography (EEG) AFE that enables non-invasive monitoring of brain waves.
The 24-bit, 8-channel ADS1299 is the first simultaneously sampling EEG AFE with input-referred-noise as low as 1 uVpp, more than 75 per cent lower than the alternative EEG AFEs. The device will also reduce board space by 70 per cent while reducing bill of materials by 40 per cent, provided it is used in a 32-electrode EEG.
The ADS1299 was designed for manufacturers of extra-cranial biopotential measurement equipment who want to reduce board space, design time and cost while improving performance. It can be used in EEG equipment to monitor bispectral index, evoked potentials and event-related potentials to diagnose brain injuries, strokes and sleep disorders. The ADS1299 can also be used in ultra-high-performance medical diagnostic and research-grade electrocardiogram (ECG) equipment.
the ADS1299 reduces board space and bill of material cost, integrates eight low-noise programmable gain amplifiers, eight high-resolution analog-to-digital converters (ADCs), test signals, bias amplifier, oscillator and reference. When used in a 32-electrode EEG, the ADS1299 significantly reduces board space and bill of material compared to alternative EEG AFEs, which provide fewer channels and require additional external components to reduce noise.
It increases equipment reliability with continuous lead-off detection option which notifies medical staff when electrodes disconnect. Due to its pin compatibility, it reduces design costs, decreases time to market.
The ADS1299 Performance Demonstration Kit (ADS1299EEG-FE) includes easy-to-use evaluation software; built-in analysis tools, including oscilloscope, FFT and histogram displays, flexible input configurations, optional external reference circuits; and the ability to export data in simple test files for post processing.