Aehr Test Systems bags deal from Korean test lab

FREMONT, USA: Aehr Test Systems, a worldwide supplier of semiconductor test and burn-in equipment has bagged a deal from a leading test lab in Korea. Aehr Test Systems received the order for its ABTS Advanced Burn-in and Test System.

"The ABTS system offers up to 256 universal pin drivers per device with up to 32 million test vectors per pin. Functional testing during burn-in helps ensure that the devices are receiving the proper stimulus during the entire reliability qualification process, which often lasts 6 weeks or longer. We expect the highly flexible and robust ABTS system to be an excellent fit for this environment,'' said Carl Buck, vice president of sales and marketing at Aehr Test Systems.

The ABTS family of products is designed to test and burn-in both logic and memory devices, including resources for high pin-count devices and configurations for high-power and low-power applications.

It maximizes system uptime by using N+1 redundancy technology for many key components in the system and it can be configured to provide individual device temperature control for devices up to 70 watts or more.